生產(chǎn)廠商：Graphene Platform (Japan)

產(chǎn)品信息

Specification of a SiO2/Si

Material : Single crystal silicon (CZ)

Orientation : ???100)

Type/Dopant : n/phosphoric

Resistivity : <50 ohm-cm

Wafer Size : 4 inch (100mm +/- 0.5 mm)

Thickness : 525 micron +/- 25 micron

Oxide Thickness: 1000aa (100nm)

Front Surface: Polished

(Representative Value)

Typical Raman spectrum of a single layer film Transferred on SiO2/Si

Explanation of Raman spectrum

1.    Raman spectroscopy is used to check the presence of a D peak in graphene samples. If a D peak is present, then this can indicate defects in the sample, such as cracks or flaking.

2.    The ratio of the heights of the 2D peak and the G peak indicate the number of graphene layers.
2D>G : Single-layer
2D=G : Double layer
2D<G : more than triple layer

3.    3 measurements for every sample are taken and presented on the same graph.