The Model 8000 Modular Controller is a cost effective solution that meets your laboratory, production, and quality control applications. A flexible system design guarantees that the Model 8000 accommodate future modules making this controller the most complete instrument for laser diode control, characterization, and testing far into the future.
This unit can only be used in the 9008 mainframe.
8350
? TEC Output Power: 40 W
? TEC Output Current: 5 A
Features:
?Complete System Controller for 8 or 16 Channel Applications
?EDFA Pumping or DWDM Signal Sources
?Outputs Configured for Either Floating or Common Anode Type LD Package Styles
?IEEE-488 (GPIB) and RS-232C Interfaces
The Models 8008, 8016, 9008 and 9016 Modular Controllers expand on Newport's modular laser diode controller concept to meet the higher channel densities found in Dense WDM (DWDM) applications and 2-D VCSEL arrays where all the lasers have similar electrical configurations. The eight or sixteen bays accept an array of LDD, TEC, and LDD/TEC combo modules.

AQ2211和AQ2212控制機(jī)架是AQ2200多應(yīng)用測量系統(tǒng)的平臺。這些控制機(jī)架包含各種測量應(yīng)用程序,無需連接外部控制器PC也能獲取需要的信息。此外,它們提供三種不同的外部接口,可以為特定測量應(yīng)用選擇*接口。
遠(yuǎn)程監(jiān)視和易于查看的彩色顯示屏,在所有應(yīng)用中均可方便地使用。
?易于查看的彩色顯示屏
?用于存儲數(shù)據(jù)的USB端口
?測量模塊“熱插拔”功能
?通過LAN進(jìn)行遠(yuǎn)程監(jiān)視和測量
易于查看的彩色顯示屏
AQ2211和AQ2212配備320×240點、寬視角、高分辨率彩色TFT顯示屏,易于查看。即使是詳細(xì)圖表,也很容易在顯示屏上查看。

Features:
?DVI Port for External Display
?GPIB and LXI-Compliant (Ethernet)
?USB Device Ports for External Keyboard and Mouse
?Field Replaceable Controller/Power Supply Module
The JDSU MAP-200 Series Multiple Application Platforms are an optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements. Today's rapidly changing optical market requires investment in productivity-enhancing technologies and tools, making the MAP-200 scalable test platform the right tool needed in even the most stringent environments. Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform. The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.

The mainframe automatically detects which module is installed in each bay and displays the system configuration on a large LCD screen. A sophisticated processor provides enhanced system control and data collection capabilities.